2003 IEEE International Reliability Physics Symposium : 41st annual, Dallas, Texas, March 30-April 4, 2003 : proceedings (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : 2003 IEEE International Reliability Physics Symposium : 41st annual, Dallas, Texas, March 30-April 4, 2003 : proceedingshttps://catalogue-scientifique.canada.ca/record=2000256~S6*frcRechercher IEEE Reliability Society; Rechercher IEEE Electron Devices Society; Rechercher Institute of Electrical and Electronics EngineersInstitute of Electrical and Electronics Engineers, 2003Actes de conférence
IEEE International Electron Devices Meeting 2003 : IEDM technical digest, Washington, DC, December 8-10, 2003 (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : IEEE International Electron Devices Meeting 2003 : IEDM technical digest, Washington, DC, December 8-10, 2003https://catalogue-scientifique.canada.ca/record=2018038~S6*frcRechercher IEEE Electron Devices Society; Rechercher Institute of Electrical and Electronics EngineersIEEE, 2003Actes de conférence
2003 IEEE Conference on Electron Devices and Solid-State Circuits : December 16-18, 2003, New World Renaissance Hotel, 22 Salisbury Road, Tsimshatsui, Kowloon, Hong Kong (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : 2003 IEEE Conference on Electron Devices and Solid-State Circuits : December 16-18, 2003, New World Renaissance Hotel, 22 Salisbury Road, Tsimshatsui, Kowloon, Hong Konghttps://catalogue-scientifique.canada.ca/record=2023165~S6*frcRechercher IEEE Electron Devices Society; Rechercher Institute of Electrical and Electronics EngineersIEEE, 2003Actes de conférence
Technical digest of the 16th International Vacuum Microelectronics Conference : July 7-11, 2003, Senri Life Science Center, Toyonaka, Osaka, Japan (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : Technical digest of the 16th International Vacuum Microelectronics Conference : July 7-11, 2003, Senri Life Science Center, Toyonaka, Osaka, Japanhttps://catalogue-scientifique.canada.ca/record=2012422~S6*frcRechercher Takai, Mikio; Rechercher Gotoh, Yasuhito; Rechercher Ishikawa, JunzoIEEE, 2003Actes de conférence
Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2004 (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2004https://catalogue-scientifique.canada.ca/record=2039266~S6*frcRechercher Chung, Steve SInstitute of Electrical and Electronics Engineers, 2004Actes de conférence
1999 IEEE International SOI Conference proceedings : October 4-7, 1999, Doubletree Hotel Sonoma County, Rohnert Park, California (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : 1999 IEEE International SOI Conference proceedings : October 4-7, 1999, Doubletree Hotel Sonoma County, Rohnert Park, Californiahttps://catalogue-scientifique.canada.ca/record=1905324~S6*frcRechercher IEEE Electron Devices Society; Rechercher Institute of Electrical and Electronics EngineersInstitute of Electrical and Electronics Engineers, 1999Actes de conférence
1999 57th Annual Device Research Conference digest : June 28-30, 1999, University of California, Santa Barbara, California (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : 1999 57th Annual Device Research Conference digest : June 28-30, 1999, University of California, Santa Barbara, Californiahttps://catalogue-scientifique.canada.ca/record=1887439~S6*frcRechercher Van Zeghbroeck, Bart; Rechercher Rodder, MarkInstitute of Electrical and Electronics Engineering, 1999Actes de conférence
IEDM technical digest : International Electron Devices Meeting, 1999, Washington, DC, December 5-8, 1999 (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : IEDM technical digest : International Electron Devices Meeting, 1999, Washington, DC, December 5-8, 1999https://catalogue-scientifique.canada.ca/record=1904662~S6*frcRechercher IEEE Electron Devices Society; Rechercher Institute of Electrical and Electronics EngineersInstitute of Electrical and Electronics Engineers, 1999Actes de conférence
Proceedings of the Thirteenth Biennial University/Government/Industry Microelectronics Symposium : June 20-23, 1999, University of Minnesota (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : Proceedings of the Thirteenth Biennial University/Government/Industry Microelectronics Symposium : June 20-23, 1999, University of Minnesotahttps://catalogue-scientifique.canada.ca/record=1885899~S6*frcRechercher IEEE Electron Devices Society; Rechercher Institute of Electrical and Electronics EngineersIEEE, 1999Actes de conférence
ICMTS 1999 : proceedings of the 1999 International Conference on Microelectronic Test Structures, March 15-18, 1999, Göteborg, Sweden (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : ICMTS 1999 : proceedings of the 1999 International Conference on Microelectronic Test Structures, March 15-18, 1999, Göteborg, Swedenhttps://catalogue-scientifique.canada.ca/record=1886047~S6*frcRechercher IEEE Electron Devices Society; Rechercher Institute of Electrical and Electronics EngineersInstitute of Electrical and Electronics Engineers, 1999Actes de conférence