https://catalogue-scientifique.canada.ca/record=2160219~S6*frc
Rechercher Katzer, D. S; Rechercher Rabinovich, W. S; Rechercher Ikossi-Anastasiou, K; Rechercher Gilbreath, G. C
naval research lab washington dc electronics science and technology div, 2000
In this work we compare the effect of the buffer layer on the device quality and surface morphology of strained InGaAs/AlGaAs PIN multiple quantum well (MQW)...
Publication gouvernementale