https://publications-cnrc.canada.ca/fra/voir/objet/?id=31f3618a-9b55-4dbb-bef6-d04247bb826d
Rechercher Peters, C. J; Rechercher Noël, J. P; Rechercher Xu, D. X; Rechercher Buchanan, M; Rechercher Du, J; Rechercher Tarr, N. G
Applied Physics Letters, 14 août 1995, Volume : 67, Numéro : 7
The residual ion damage due to low-energy ion implantation during molecular beam epitaxy growth was investigated by measuring the minority carrier lifetime in...
Article de périodique (revue)