https://publications-cnrc.canada.ca/fra/voir/objet/?id=86540206-334a-40fb-9ebd-5298a9ab9025
Rechercher Bardwell, J. A; Rechercher Dharma-Wardana, M. W. C; Rechercher Leathem, B; Rechercher Moisa, S; Rechercher Webb, J. B; Rechercher Tam, B
Journal Of The Electrochemical Society, 1999, Volume : 146, Numéro : 8
An infrared spectroscopic technique has been developed for the characterization of GaN epitaxially grown thin films on sapphire substrates. The technique is...
Article de périodique (revue)