https://publications-cnrc.canada.ca/fra/voir/objet/?id=c7d60a7f-7b50-4b75-ab54-3282324b40c9
Rechercher Robertson, M. D; Rechercher Currie, J. E; Rechercher Corbett, J. M; Rechercher Webb, J. B
Ultramicroscopy, mai 1995, Volume : 58, Numéro : 2
A new technique is presented to directly measure strains in epitaxial systems from high-resolution electron microscope (HREM) images. This method involves the...
Article de périodique (revue)