https://publications-cnrc.canada.ca/fra/voir/objet/?id=9ca80426-651f-4ddf-a2ae-d37e3e915612
Rechercher Mailhot, S; Rechercher Baribeau, J. M; Rechercher Bruce, D. M; Rechercher Delâge, A; Rechercher Janz, S; Rechercher Jessop, P. E; Rechercher Lafontaine, H; Rechercher Robillard, M; Rechercher Williams, R. L; Rechercher Xu, D. X
MRS Proceedings, janvier 1997, Volume : 486
The index of refraction of pseudomorphic layers grown on Si has been determined at wavelengths λ=1330 nm and λ= 1550 nm, for Ge concentrations between x=0.01...
Article de périodique (revue)