https://catalogue-scientifique.canada.ca/record=2234096~S6*frc
Rechercher Derenge, M. A; Rechercher Ervin, M. H; Rechercher Kirchner, K. W; Rechercher Jones, K. A; Rechercher Wood, M. C; Rechercher Zheleva, T. S
army research lab adelphi md, 2006
We show how defects in semiconductor device structures are formed, how they can affect the properties and reliability of devices, and how they might be...
Publication gouvernementale