https://publications-cnrc.canada.ca/fra/voir/objet/?id=89f7d215-f251-4818-a9e0-8233ed7aa355
Rechercher Simpson, T. W; Rechercher Love, D; Rechercher Endisch, D; Rechercher Goldberg, R. D; Rechercher Mitchell, I. V; Rechercher Haynes, T. E; Rechercher Baribeau, J.-M
1994 MRS Fall Meeting: Symposium Y: Microstructure of Irradiated Materials, Cambridge University Press, 1995
We have examined the damage produced by Si-ion implantation into strained Si₁₋ₓGeₓ epilayers. Damage accumulation in the implanted layers was monitored in situ...
Article de périodique (revue)