IEEE transactions on reliability (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : IEEE transactions on reliabilityhttps://catalogue-scientifique.canada.ca/record=1013029~S6*frcRechercher American Society for Quality. Electronics & Communications Division; Rechercher Institute of Electrical and Electronics Engineers. Professional Technical Group on ReliabilityInstitute of Electrical and Electronics Engineers, ISSN : 1558-1721Périodique (revue)
1980 proceedings annual Reliability and Maintainability Symposium : San Francisco, CA, USA, 1980 January 22-24 : the forum for the assurance technologies (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : 1980 proceedings annual Reliability and Maintainability Symposium : San Francisco, CA, USA, 1980 January 22-24 : the forum for the assurance technologieshttps://catalogue-scientifique.canada.ca/record=1215740~S6*frcRechercher RAMS; Rechercher IEEE Reliability Society; Rechercher IEEE Reliability Group; Rechercher Institute of Electrical and Electronics EngineersInstitute of Electrical and Electronics Engineers, 1980Livre
Proceedings : Third annual seminar on failure analysis, may 21, 1970 (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : Proceedings : Third annual seminar on failure analysis, may 21, 1970https://catalogue-scientifique.canada.ca/record=2232357~S6*frcRechercher IEEE Reliability Group; Rechercher Institute of Electrical and Electronics Engineers. Philadelphia SectionIEEE Philadelphia Section and Reliability Group, 1970Livre
1977 Annual Reliability and Maintainability Symposium : proceedings : Philadelphia, Pennsylvania, 1977 January 18-20 (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : 1977 Annual Reliability and Maintainability Symposium : proceedings : Philadelphia, Pennsylvania, 1977 January 18-20https://catalogue-scientifique.canada.ca/record=1335340~S6*frcRechercher IEEE Reliability GroupIEEE, 1977Actes de conférence
Combined proceedings of the 1990 and 1991 Leesburg Workshops on Reliability and Maintainability Computer-aided Engineering in Concurrent Engineering (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : Combined proceedings of the 1990 and 1991 Leesburg Workshops on Reliability and Maintainability Computer-aided Engineering in Concurrent Engineeringhttps://catalogue-scientifique.canada.ca/record=1555584~S6*frcRechercher IEEE Reliability Group; Rechercher IEEE Reliability SocietyInstitute of Electrical and Electronics Engineers, 1991Actes de conférence
R&M-CAE : 1988 proceedings, Reliability & Maintainability in Computer-Aided Engineering Workshop : 1988 September 27-29, Leesberg, Virginia USA (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : R&M-CAE : 1988 proceedings, Reliability & Maintainability in Computer-Aided Engineering Workshop : 1988 September 27-29, Leesberg, Virginia USAhttps://catalogue-scientifique.canada.ca/record=1457341~S6*frcRechercher McAfee, Naomi JIEEE, 1989Actes de conférence
IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Societyhttps://catalogue-scientifique.canada.ca/record=1954255~S6*frcRechercher IEEE Reliability Society; Rechercher IEEE Electron Devices Society; Rechercher Institute of Electrical and Electronics EngineersInstitute of Electrical and Electronics Engineers, ISSN : 1530-4388Périodique (revue)
IEEE transactions on semiconductor manufacturing : a publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society, the IEEE Solid-State Circuits Council (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : IEEE transactions on semiconductor manufacturing : a publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society, the IEEE Solid-State Circuits Councilhttps://catalogue-scientifique.canada.ca/record=1043452~S6*frcRechercher IEEE Reliability Society; Rechercher IEEE Components, Hybrids, and Manufacturing Technology Society; Rechercher Components, Packaging & Manufacturing Technology Society; Rechercher IEEE Electron Devices Society; Rechercher IEEE Solid-State Circuits CouncilInstitute of Electrical and Electronics Engineers, ISSN : 0894-6507Périodique (revue)
11th Inter-RAM : international, reliability, availability, maintainability, April 4-6, 1984, Las Vegas, Nevada : papers (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : 11th Inter-RAM : international, reliability, availability, maintainability, April 4-6, 1984, Las Vegas, Nevada : papershttps://catalogue-scientifique.canada.ca/record=1360578~S6*frcRechercher IEEE Reliability Group; Rechercher IEEE Reliability Society; Rechercher Nevada Power Companys.n., 1984Actes de conférence
Proceedings of the IASTED International Conference: Reliability, Quality Control and Risk Assessment : Cambridge, Massachusetts, USA, October 18-20, 1993 (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : Proceedings of the IASTED International Conference: Reliability, Quality Control and Risk Assessment : Cambridge, Massachusetts, USA, October 18-20, 1993https://catalogue-scientifique.canada.ca/record=1598638~S6*frcRechercher Pham, Hoan; Rechercher Hamza, M. HIASTED, 1993Actes de conférence