https://catalogue-scientifique.canada.ca/record=2182219~S6*frc
Rechercher O, Beom-Hoan; Rechercher Choi, Chul-Hyun; Rechercher Jo, Soo-Beom; Rechercher Lee, Min-Woo; Rechercher Park, Dong-Gue; Rechercher Kang, Byeong-Gwon; Rechercher Kim, Sun-Hyung; Rechercher Liu, Rong; Rechercher Li, Yang Y; Rechercher Sailor, Michael J; Rechercher Fainman, Yeshaiahu
inha univ incheon (south korea), 2005
The optical form birefringence in porous silicon films is measured by analyzing the transmitted interference intensity of a polarization interferometer. A...
Publication gouvernementale