https://catalogue-scientifique.canada.ca/record=2235013~S6*frc
Rechercher Mittereder, J. A; Rechercher Binari, S. C; Rechercher Klein, P. B; Rechercher Roussos, J. A; Rechercher Katzer, D. S; Rechercher Storm, D. F; Rechercher Koleske, D. D; Rechercher Wickenden, A. E; Rechercher Henry, R. L
naval research lab washington dc, 2003
Current collapse is observed to be induced in AlGaN/GaN high-electron-mobility transistors as a result of short-term bias stress. This effect was seen in...
Publication gouvernementale