We developed a new method for characterization of detector performance used in the transmission electron microscope (TEM) based on the measured contrast of...
Off-axis electron holography is a method for the transmission electron microscope (TEM) that measures the electric and magnetic properties of a specimen. The...
Off-axis electron holography is a wavefront-split interference method for the transmission electron microscope that allows the phase shift and amplitude of the...
Microscopy and Microanalysis, Cambridge University Press, 23 novembre 2012, Volume : 18, Numéro : S2
Energy electron-loss spectroscopy (EELS) often requires extensive post-processing for quantitative interpretation of measured spectra [1, 2]. Often the first...
Microscopy and Microanalysis, Cambridge University Press, 1 août 2015, Volume : 21, Numéro : S3
A thin film irradiated by high-energy primary electrons (PE) emits secondary electrons (SE). The SE are either emitted from the sample (SEα) or travel within...
Microscopy and Microanalysis, Cambridge University Press, 11 août 2011, Volume : 17, Numéro : S2
Electron holography has been used to characterize electrostatic and magnetic behaviour of specimens in transmission electron microscopy. Although widely...
Microscopy and Microanalysis, Cambridge University Press, 9 octobre 2013, Volume : 19, Numéro : S2
Modern transmission electron microscope (TEM) enables complicated experiments that require many hardware (HW) units to work together correctly. For example, an...