https://catalogue-scientifique.canada.ca/record=2115292~S6*frc
Rechercher Christofferson, James; Rechercher Vashaee, Daryoosh; Rechercher Shakouri, Ali; Rechercher Melese, Philip; Rechercher Baskin, Jack
california univ santa cruz school of engineering, 2006
Non-contact optical methods can be used for sub micron surface thermal characterization of active semiconductor devices. Point measurements were first made,...
Publication gouvernementale