https://publications-cnrc.canada.ca/fra/voir/objet/?id=f5baa648-830d-4ff1-81a0-559107b367f5
Rechercher Kupsta, Martin; Rechercher Li, Peng; Rechercher Elliott, Glen; Rechercher Mikula, Randy; Rechercher Malac, Marek
Microscopy and Microanalysis, Cambridge University Press, 23 novembre 2012, Volume : 18, Numéro : S2
FIB sample preparation for transmission electron microscopy (TEM) analysis is used to observe a site specific area of a sample. Here we report on cryo-TEM...
Article de périodique (revue)