https://publications-cnrc.canada.ca/fra/voir/objet/?id=91297693-efcc-4678-b190-297d4682e8ae
Journal of Electron Microscopy, Japanese Society of Microscopy, 1 janvier 2000, Volume : 49, Numéro : 2
In situ scanning electron microscopy has been used to control Au island formation on a patterned Si(III) surface with a periodic array of atomicstep bunches...
Article de périodique (revue)