https://publications-cnrc.canada.ca/fra/voir/objet/?id=495b88f1-4caf-48fe-84be-813576183067
Rechercher Malac, Marek; Rechercher Hettler, Simon; Rechercher Hayashida, Misa; Rechercher Kawasaki, Masahiro; Rechercher Konyuba, Yuji; Rechercher Okura, Yoshi; Rechercher Iijima, Hirofumi; Rechercher Ishikawa, Isamu; Rechercher Beleggia, Marco
Micron, 3 avril 2017, Volume : 100
Detailed simulations are necessary to correctly interpret the charge polarity of electron beam irradiated thin film patch. Relying on systematic simulations we...
Article de périodique (revue)