https://publications-cnrc.canada.ca/fra/voir/objet/?id=2eabda7f-a7ca-42c8-8856-74bdf2ca315e
Rechercher Mutus, J.Y; Rechercher Livadaru, L; Rechercher Robinson, J.T; Rechercher Urban, R; Rechercher Salomons, M.H; Rechercher Cloutier, M; Rechercher Wolkow, R.A
New Journal of Physics, 2011, Volume : 13
Point projection microscopy (PPM) is used to image suspended graphene by using low-energy electrons (100-205 eV). Because of the low energies used, the...
Article de périodique (revue)