https://publications-cnrc.canada.ca/fra/voir/objet/?id=9d91393b-1d4c-4ba1-96ca-1f887d7872cc
Thin Solid Films, 20 décembre 1992, Volume : 222, Numéro : 1/2
Two SiGe multiple quantum well structures that had been characterized already by double-crystal X-ray diffraction (DCXRD) have been examined by spectroscopic...
Article de périodique (revue)