https://publications-cnrc.canada.ca/fra/voir/objet/?id=63ede26e-faf8-4d5e-937b-23c27fc5e921
Rechercher Soong, Charles; Rechercher Hoyle, David; Rechercher Malac, Marek; Rechercher Egerton, Ray
Microscopy and Microanalysis, Cambridge University Press, 23 novembre 2012, Volume : 18, Numéro : S2
Contamination is a long standing problem in electron microscopy [1,2,3]. It can arise from poor vacuum, from sample handling and storage, or from the nature of...
Article de périodique (revue)