https://publications-cnrc.canada.ca/fra/voir/objet/?id=ea55f9ea-5580-44de-978d-684f3e5ac686
Rechercher Fritzsche, Helmut; Rechercher Root, John; Rechercher Temst, Kristiaan; Rechercher Van Haesendonck, Chris
Physica B. Condensed Matter, 15 novembre 2006, Volume : 385-386, Numéro : Part 1
We performed polarized neutron reflectometry measurements on a 78?nm-thick Au97Fe3 film prepared on a thermally oxidized Si wafer. The measurements were done...
Article de périodique (revue)