https://publications-cnrc.canada.ca/fra/voir/objet/?id=b1155f34-c5f9-4c74-b920-7491dec808ea
Microscopy and Microanalysis, juillet 2016, Volume : 22, Numéro : S3
The scanning ion microscopy is gaining momentum as it provides several key advantages over scanning electron microscopy: (i) enhanced depth of focus, (ii)...
Article de périodique (revue)