https://catalogue-scientifique.canada.ca/record=2110286~S6*frc
Rechercher Tsakalakos, Thomas; Rechercher Croft, Mark C; Rechercher Zhong, Z; Rechercher Holtz, R; Rechercher Sadananda, K
rutgers - the state univ new brunswick nj, 2006
The application of high-resolution strain mapping in large engineering samples with both high-spatial and strain resolution is reviewed in this report using...
Publication gouvernementale