https://catalogue-scientifique.canada.ca/record=2120647~S6*frc
Rechercher Christofferson, James; Rechercher Vashaee, Daryoosh; Rechercher Shakouri, Ali; Rechercher Melese, Philip
california univ santa cruz, 2001
Thermal measurements on a sub-micron scale are non-trivial, but are important of the characterization of modern, semiconductor and opto-electronic devices. In...
Publication gouvernementale