https://publications-cnrc.canada.ca/fra/voir/objet/?id=4abdb180-f750-4d41-a458-37f856e2e1d2
Rechercher Malac, Marek; Rechercher Schoefield, Marvin; Rechercher Zhu, Yimei; Rechercher Egerton, Raymond
Journal of Applied Physics, 15 juillet 2002, Volume : 92, Numéro : 2
We have studied electron-beam exposure of cobalt fluoride (CoF2) thin films by real-time high-resolution transmission electron microscopy and by electron...
Article de périodique (revue)