https://publications-cnrc.canada.ca/fra/voir/objet/?id=fabed280-81e3-4aa5-a0c5-04ea72b8d784
Rechercher Hettler, Simon; Rechercher Dries, Manuel; Rechercher Hermann, Peter; Rechercher Obermair, Martin; Rechercher Gerthsen, Dagmar; Rechercher Malac, Marek
Micron, Elsevier, 11 février 2017, Volume : 96
We analyze electron-beam induced carbon contamination in a transmission electron microscope. The study is performed on thin films potentially suitable as phase...
Article de périodique (revue)