https://publications-cnrc.canada.ca/fra/voir/objet/?id=a6bd8274-28cb-4ae5-9187-9e3cf7f947e6
Rechercher Ma, Rubin; Rechercher Lapointe, Jean; Rechercher Storey, Craig; Rechercher Poole, Philip; Rechercher Jiang, Frank; Rechercher Seyfollahi, Alireza; Rechercher Walker, Alexandre W; Rechercher Noël, Jean-Paul; Rechercher Kam, Alicia; Rechercher Densmore, Adam
Journal of Vacuum Science & Technology B, AIP Publishing, 16 mars 2020, Volume : 38, Numéro : 2
In this work, the authors evaluated the access resistance of InP high electron mobility transistors (HEMTs) and their degradation during wafer processing. The...
Article de périodique (revue)